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http://dx.doi.org/10.5573/JSTS.2012.12.3.266

High-efficiency BIRA for embedded memories with a high repair rate and low area overhead  

Lee, Joo-Hwan (Graduate School of Electrical and Electronic Engineering, Yonsei University)
Park, Ki-Hyun (Graduate School of Electrical and Electronic Engineering, Yonsei University)
Kang, Sung-Ho (Graduate School of Electrical and Electronic Engineering, Yonsei University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.12, no.3, 2012 , pp. 266-269 More about this Journal
Abstract
High-efficiency built-in redundancy analysis (BIRA) is presented. The proposed BIRA uses three techniques to achieve a high repair rate using spare mapping registers with adjustable fault tags to reduce area overhead. Simulation results show that the proposed BIRA is a reasonable solution for embedded memories.
Keywords
Built-in redundancy analysis; repair rate; area overhead; embedded memory;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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