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http://dx.doi.org/10.5573/JSTS.2009.9.4.198

Design of a Reliable Broadband I/O Employing T-coil  

Kim, Seok (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Kim, Shin-Ae (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Jung, Goeun (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Kwon, Kee-Won (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Chun, Jung-Hoon (Department of Semiconductor Systems Engineering, Sungkyunkwan University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.9, no.4, 2009 , pp. 198-204 More about this Journal
Abstract
Inductive peaking using T-coils has been widely used in broadband I/O interfaces. In this paper, we analyze technical effects and limitations of the T-coil, and discuss several methods that can overcome these restrictions and improve the practicality of the T-coil. In particular we also propose and verify a circuit topology which can further extend bandwidth beyond the limit that conventional T-coil can achieve, and transfer 20 Gb/s data without noticeable distortion.
Keywords
Inductive peaking; T-coil; ESD; high-speed interface; reliability;
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