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http://dx.doi.org/10.5573/JSTS.2007.7.4.260

Signal Transient and Crosstalk Model of Capacitively and Inductively Coupled VLSI Interconnect Lines  

Kim, Tae-Hoon (Department of Electrical and Computer Engineering, Hanyang University)
Kim, Dong-Chul (Department of Electrical and Computer Engineering, Hanyang University)
Eo, Yung-Seon (Department of Electrical and Computer Engineering, Hanyang University)
Publication Information
JSTS:Journal of Semiconductor Technology and Science / v.7, no.4, 2007 , pp. 260-266 More about this Journal
Abstract
Analytical compact form models for the signal transients and crosstalk noise of inductive-effect-prominent multi-coupled RLC lines are developed. Capacitive and inductive coupling effects are investigated and formulated in terms of the equivalent transmission line model and transmission line parameters for fundamental modes. The signal transients and crosstalk noise expressions of two coupled lines are derived by using a waveform approximation technique. It is shown that the models have excellent agreement with SPICE simulation.
Keywords
Crosstalk; inductance effect; interconnect lines; signal transient; transmission lines;
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