Accurate Extraction of Crosstalk Induced Dynamic Variation of Coupling Capacitance for Interconnect Lines of CMOSFETs |
Kim, Yong-Goo
(Dept. of Electronics Engineering, Chungnam National University)
Ji, Hee-Hwan (Dept. of Electronics Engineering, Chungnam National University) Yoon, Hyung-Sun (Dept. of Electronics Engineering, Chungnam National University) Park, Sung-Hyung (System IC Technology & Product Development Center, Hynix Semiconductor) Lee, Heui-Seung (System IC Technology & Product Development Center, Hynix Semiconductor) Kang, Young-Seok (System IC Technology & Product Development Center, Hynix Semiconductor) Kim, Dae-Byung (System IC Technology & Product Development Center, Hynix Semiconductor) Kim, Dae-Mann (Computational Sciences, Korea Institute for Advanced Study) Lee, Hi-Deok (Dept. of Electronics Engineering, Chungnam National University) |
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