Zero-Current Phenomena Analysis of the Single IGBT Open Circuit Faults in Two-Level and Three-Level SVGs |
Wang, Ke
(School of Electrical and Power Engineering, China University of Mining and Technology)
Zhao, Hong-Lu (School of Electrical and Power Engineering, China University of Mining and Technology) Tang, Yi (School of Electrical and Power Engineering, China University of Mining and Technology) Zhang, Xiao (School of Electrical and Power Engineering, China University of Mining and Technology) Zhang, Chuan-Jin (School of Electrical and Power Engineering, China University of Mining and Technology) |
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