Degradation behaviors and failure analysis of base–metal electrode multilayer ceramic capacitors under highly accelerated life test |
Kim, Jung-Woo
(School of Materials Science & Engineering, Pusan National University)
Yoon, Dong-Cheol (School of Materials Science & Engineering, Pusan National University) Jeon, Min-Seok (Material Testing Center, Korea Testing Laboratory) Kang, Do-Won (LCR Division, Samsung Electro-mechanics Co. Ltd.) Kim, Jeong-Wook (LCR Division, Samsung Electro-mechanics Co. Ltd.) Lee, Hee-Soo (School of Materials Science & Engineering, Pusan National University) |
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