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http://dx.doi.org/10.3807/JOSK.2015.19.5.503

Measuring the Thickness of Flakes of Hexagonal Boron Nitride Using the Change in Zero-Contrast Wavelength of Optical Contrast  

Kim, Dong Hyun (Department of Physics, Chungnam National University)
Kim, Sung-Jo (Department of Physics, Chungnam National University)
Yu, Jeong-Seon (Department of Physics, Chungnam National University)
Kim, Jong-Hyun (Department of Physics, Chungnam National University)
Publication Information
Journal of the Optical Society of Korea / v.19, no.5, 2015 , pp. 503-507 More about this Journal
Abstract
Using the reflectivity mode of an optical microscope, we analyzed the optical contrast to identify the layer number of flakes of hexagonal boron nitride on a $SiO_2$/Si substrate. Overall optical contrast in the visible range varies with the thickness of flakes. However, the wavelength of zero contrast exhibits a linear redshift of 0.53 nm per layer, independent of the $SiO_2$ thickness, and increases proportionally with $SiO_2$thickness. Experiments show good agreement with calculations and the results of AFM measurements. These results show that this zero-contrast approach is more accurate and easier than the reflectivity-contrast approach using the overall optical contrast.
Keywords
Thickness; Optical contrast; h-BN; Microscope;
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Times Cited By KSCI : 2  (Citation Analysis)
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