Browse > Article
http://dx.doi.org/10.3807/JOSK.2015.19.2.144

Alternative Description for Gaussian Image Plane  

Kim, Byongoh (Department of Physics, Inha University)
Lee, Sukmock (Department of Physics, Inha University)
Publication Information
Journal of the Optical Society of Korea / v.19, no.2, 2015 , pp. 144-148 More about this Journal
Abstract
An alternative description for the Gaussian image plane (GIP) of an optical system for a given object is presented, which applies to both aberration-free and non-aberration-free systems. We extend the definition of transverse magnification (TM) to the image plane (IP) displaced from the GIP and find that the TM depends linearly on the locations of both an aperture stop placed in front of the system and the IP. Hence, we redefine the GIP as the location at which the slope of the TM variance changes sign. The definition is deterministic and self-consistent and, therefore, no other parameters or measurements are needed. The derivation of this definition using a set of paraxial ray tracings and supporting experimental data for a thick bi-convex lens system is presented.
Keywords
Transverse magnification; Gaussian image plane;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 W. T. Welford, Aberrations of Optical Systems (CRC Press, 1986).
2 R. Kingslake, "A new bench for testing photographic lenses," J. Opt. Soc. Am. 22, 207-222 (1932).   DOI
3 Y. Nakano and K. Murata, "Talbot interferometry for measuring the focal length of a lens," Appl. Opt. 24, 3162-3166 (1985).   DOI
4 J. Jeong, B. Lee, and S. Lee, "Determination of paraxial image plane location by using Ronchi test," Opt. Express 18, 18249-18253 (2010).   DOI
5 O. Faugeras, Three-Dimensional Computer Vision: A Geometric Viewpoint (MIT Press, 1993).
6 S. Lee and B. Kim, "Determination of transverse magnifications by distortion analysis," J. Opt. Soc. Korea 17, 136-141 (2013).   DOI   ScienceOn
7 S. Lee, R. Roberts, and J. H. Burge, "Self-consistent way to determine relative distortion of axial symmetric lens systems," Appl. Opt. 51, 588-593 (2012).   DOI
8 S. Lee, B. Kim, J. Lee, and J. Sasian, "Accurate determination of distortion for smartphone cameras," Appl. Opt. 53, H1-H6 (2014).   DOI