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http://dx.doi.org/10.3807/JOSK.2013.17.2.136

Determination of Transverse Magnifications by Distortion Analysis  

Lee, Sukmock (Department of Physics, Inha University)
Kim, Byungoh (Department of Physics, Inha University)
Publication Information
Journal of the Optical Society of Korea / v.17, no.2, 2013 , pp. 136-141 More about this Journal
Abstract
A method to determine the transverse magnification (TM) of an imaging system is discussed. This method is different in that TM can be determined accurately by using distortion analysis. We demonstrate the validity of the method via numerical simulation with accompanying experimental data for a thick bi-convex lens.
Keywords
Transverse magnification; Distortion;
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  • Reference
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