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http://dx.doi.org/10.3807/JOSK.2012.16.2.091

Alternative Method of AWG Phase Measurement Based on Fitting Interference Intensity  

Oh, Yong Ho (Division of Semiconductor and Microelectronics Technology, Wonkwang University)
Lim, Sungwoo (Division of Semiconductor and Microelectronics Technology, Wonkwang University)
Go, Chun Soo (Division of Semiconductor and Microelectronics Technology, Wonkwang University)
Publication Information
Journal of the Optical Society of Korea / v.16, no.2, 2012 , pp. 91-94 More about this Journal
Abstract
Arrayed waveguide grating (AWG) phase errors are normally assessed from the Fourier transform of the interference intensity data in the frequency domain method. However it is possible to identify the phases directly from the intensity data if one adopts a trial-and-error method. Since the functional form of the intensity profile is known, the intensities can be calculated theoretically by assuming arbitrary phase errors. Then we decide the phases that give the best fit to the experimental data. We verified this method by a simulation. We calculated the intensities for an artificial AWG which is given arbitrary phases and amplitudes. Then we extracted the phases and amplitudes from the intensity data by using our trial-and-error method. The extracted values are in good agreement with the originally given values. This approach yields better results than the analysis using Fourier transforms.
Keywords
Arrayed waveguide grating (AWG); AWG phase error; Interferometer; Monte-Carlo method; Intensity fitting;
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1 K. Takada, Y. Takada, A. Yokota, and S. Satoh, "Metal mask fabrication with an inkjet printer for AWG phase trimming using a photosensitive refractive index change," IEEE Photon. Technol. Lett. 17, 813-815 (2005).   DOI   ScienceOn
2 K. Takada, M. Abe, M. Shibata, M. Ishii, and K. Okamoto, "Low-corsstalk 10-GHz-spaced 512-channel arrayed-waveguide grating multi/demultiplexer fabricated on a 4-in wafer," IEEE Photon. Technol. Lett. 13, 1182-1184 (2001).   DOI   ScienceOn
3 K. Takada, H. Yamada, and Y. Inoue, "Optical low coherence method for characterizing silica-based arrayed-waveguide gratings multiplexers," J. Lightwave Technol. 14, 1677-1689 (1996).   DOI   ScienceOn
4 J. A. Lazaro, R. Wessel, J. Koppenborg, G. Dudziak, and I. J. Blewett, "Inverse Fourier tramsform method for characterizing arrayed-waveguide grating," IEEE Photon. Technol. Lett. 15, 93-95 (2003).   DOI   ScienceOn
5 W. Chen, Y. J. Chen, M. Yan, B. McGinnis, and Z. Wu, "Improved techniques for the measurement of phase error in waveguide based optical devices." J. Lightwave Technol. 21, 198-205 (2003).   DOI   ScienceOn
6 K. Takada and K. Okamoto, "Frequency-domain measurement of phase error distribution in narrow-channel arrayed waveguide grating," Electron. Lett. 36, 160-161 (2000).
7 K. Takada and S. Satoh, "Method for measuring the phase error distribution of a wideband arrayed waveguide grating in the frequency domain," Opt. Lett. 31, 323-325 (2006).   DOI   ScienceOn
8 K. Takada and T. Hirose, "Phase modulation method for AWG phase-error measurement in the frequency domain," Opt. Lett. 34, 3914-3916 (2009).   DOI   ScienceOn
9 C. S. Go, Y. H. Oh, and S. Lim, "Measurement of the phase errors of AWG by using the Monte-Carlo Analysis." Korean J. Opt. Photon. 22, 207-213 (2011).   DOI   ScienceOn
10 C. R. Doerr and K. Okamoto, "Advances in silica planar lightwave circuit," J. Lightwave Technol. 24, 4763-4789 (2006).   DOI   ScienceOn
11 E. C. Sim, F. M. Abbou, and A. R. Faidz, "System degradation due to phase error induced crosstalk in WDM optical networks employing arrayed waveguide grating multi/demultiplexer," Opt. Quant. Electron. 39, 553-560 (2007).   DOI