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http://dx.doi.org/10.3807/JOSK.2011.15.2.146

Precise Test Sieves Calibration Method Based on Off-axis Digital Holography  

Abdelsalam, Dahi Ghareab (Division of Mechanical System Engineering, Chonbuk National University)
Baek, Byung-Joon (Division of Mechanical System Engineering, Chonbuk National University)
Kim, Dae-Suk (Division of Mechanical System Engineering, Chonbuk National University)
Publication Information
Journal of the Optical Society of Korea / v.15, no.2, 2011 , pp. 146-151 More about this Journal
Abstract
We describe, throughout a Mach-Zehnder interferometric configuration, a new test sieves calibration method based on off-axis digital holography. The experiment is conducted on a test sieve of square openings. The nominal sieve opening is 1.00 mm with maximum individual opening of 1.14 mm in size. The recorded off-axis hologram is numerically processed using Fresnel transforms to obtain an object wave (amplitude and phase). From the reconstructed phase, the average size of the illuminated openings has been measured precisely. The proposed method can provide a real time solution for calibrating test sieves very precisely and with moderate accuracy.
Keywords
Digital holography; Mach-Zehnder interferometer; Off-axis geometry; Numerical reconstruction; Sieves calibration;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
Times Cited By Web Of Science : 2  (Related Records In Web of Science)
Times Cited By SCOPUS : 2
연도 인용수 순위
1 Y. Ohtsuka and K. Oka, "Contour mapping of the spatiotemporal state of polarization of light," Appl. Opt. 33, 2633-2636 (1994).   DOI
2 H. Lee, S. Kim, and D. Kim, "Two step on-axis digital holography using dual-channel Mach-Zehnder interferometer and matched filter algorithm," J. Opt. Soc. Korea 14, 363-367 (2010).   과학기술학회마을   DOI   ScienceOn
3 D. G. Abdelsalam, B. J. Baek, Y. J. Cho, and D. Kim, "Surface form measurement using single-shot off-axis Fizeau interferometer," J. Opt. Soc. Korea 14, 409-414 (2010).   과학기술학회마을   DOI   ScienceOn
4 B. Javidi and D. Kim, "Three-dimensional-object recognition by use of single-exposure on-axis digital holography," Opt. Lett. 30, 236-238 (2005).   DOI   ScienceOn
5 J. Kuhn, T. Colomb, F. Montfort, F. Charriere, Y. Emery, E. Cuche, P. Marquet, and C. Depeursinge, "Real-time dualwavelength digital holographic microscopy with a single hologram acquisition," Opt. Express 15, 7231-7242 (2007).   DOI
6 E. Cuche, P. Marquet, and C. Depeursinge, "Spatial filtering for zero-order and twin image elimination in digital off-axis holography," Appl. Opt. 39, 4070-4075 (2000).   DOI
7 M. Born and E. Wolf, Principles of Optics (Cambridge: Cambridge University Press, UK, 1980), pp. 459-490.
8 E. Cuche, P. Marquet, and C. Depeursinge, "Aperture apodization using cubic spline interpolation: application in digital holographic microscopy," Opt. Comm. 182, 59-69 (2000).   DOI   ScienceOn
9 Guide To the Expression of Uncertainty in Measurement, International Organization for Standardization, ISO (1995).
10 R. Wilson, K. Leschonski, W. Alex, T. Allen, and B. Coglin, "Certification report on reference materials of defined particle size," Commission of the European Communities; BCR Report: EUR 6825 EN (1980).
11 F. G. Carpenter and V. R. Deitz, "Methods of sieve analysis with particular reference," J. Res. NBS 45, 328-345 (1950).
12 F. G. Carpenter and V. R. Deitz, "Glass sphere for the measurement of effective opening of test sieves," J. Res. NBS 47, 139 (1951).
13 E. Cuche, F. Bevilacqua, and C. Depeursinge, "Digital holography for quantitative phase-contrast imaging," Opt. Lett. 24, 291-293 (1999).   DOI
14 D. Gabor, "A new microscopic principle," Nature (London) 161, 777-778 (1948).   DOI