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http://dx.doi.org/10.33851/JMIS.2021.8.2.143

Linearized Transistor Model Based Automated Biasing Scheme for Analog Integrated Circuits  

Lacek, Matthew (Department of Electrical and Computer Engineering, The University of Akron)
Nahra, Daniel (Department of Electrical and Computer Engineering, The University of Akron)
Roter, Ben (Department of Electrical and Computer Engineering, The University of Akron)
Lee, Kye-Shin (Department of Electrical and Computer Engineering, The University of Akron)
Publication Information
Journal of Multimedia Information System / v.8, no.2, 2021 , pp. 143-146 More about this Journal
Abstract
This work presents an automated transistor biasing scheme for analog integrated circuits. In order to effectively bias the transistor at a desired operating point, the proposed method uses a linearized transistor circuit model along with the curve fitted expressions obtained from the pre-simulated I-V characteristics of the actual transistor. As a result, the transistor size that leads to the desired operating point can be easily determined without heavily relying on the circuit simulator, which will lead to significant design time reduction. Furthermore, the proposed method is applied to an actual amplifier circuit where the design time based on the proposed biasing method showed 10× faster than the conventional design approach using the circuit simulator.
Keywords
Automated transistor biasing; Linearized transistor circuit model; Pre-simulated I-V data;
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