Review paper: Application of the Pulsed Eddy Current Technique to Inspect Pipelines of Nuclear Plants |
Park, D.G.
(Nuclear Materials Research Division, Korea Atomic Energy Research Institute)
Angani, C.S. (Nondestructive Evaluation Division, Indira Gandhi Center for Atomic Research (IGCAR)) Kishore, M.B. (Nuclear Materials Research Division, Korea Atomic Energy Research Institute) Vertesy, G. (Research Center for Natural Sciences, Institute of Technical Physics and Materials Science) Lee, D.H. (Nuclear Materials Research Division, Korea Atomic Energy Research Institute) |
1 | G. Y. Tian and A. Sophian, Insight 47, 277 (2005). DOI |
2 | C. V. Dodd and W. E. Deeds, J. Appl. Phys 39, 2829 (1968). DOI |
3 | I. Z. Abidin, C. Mandache, and G. Y. Tian, NDT&E International 42, 599 (2009). DOI ScienceOn |
4 | N. Nair, V. Melapudi, J. Hector, X. Liu, Y. Deng, Z. Zang, L. Udpa, J. M. Thomas, and S. Udpa, IEEE Trans. Magn. 42, 3312 (2006). DOI ScienceOn |
5 | W. Youhua, W. Junhua, L. Jiangui, and L. Haohua, Proc. of Int. Conf. CTEEE, Novosibirsk, Russia, the IEEE Region 8 Sibircon, 238 (2008). |
6 | C. J. Renken, Materials Evaluation 59, 356 (2001). |
7 | R. Griberg, L. Udpa, A. Savin, R. Steigmann, V. Palihovic, and S. S. Udpa, NDT&E Int. 39, 264 (2006). DOI ScienceOn |
8 | A. Sophian, G. Y. Tian, D. Taylor, an J. Rudlin, NDT & E int. 36, 37 (2003). DOI ScienceOn |
9 | Zhang Gang and Zhao Liang, Transducer and Microsystems Technologies 25, 35 (2006). |
10 | J. Blitz, Chapman & Hall, London, 1997. |
11 | M. A. Robers and R. S. Scottini, Proc. of 8th ECNDT conf, ndt.net, 7, Barcelona, June (2002). |
12 | R. A. Smith and G. R. Hugo, Insight 43, 14 (2001). |
13 | J. Bowler, Rev. Trog. Prog. QNDE 9, 287 (1990). |
14 | J. Bowler and M. Johnson, IEEE Trans. Magn. 33, 2258 (2007). |
15 | V. O. de Haan and P. A. de Jong, IEEE, Trans. Magn. 40, 371 (2004). DOI ScienceOn |
16 | M. J. Cohn and J. W. Norton, Proceeding of PVP 2008, ASME Pressure Vessels and Piping Division Conference. |
17 | M. A. Roberts and R. Scottomo, Pulsed eddy current in corrosion detection, www.ndt.net/article.Ecndt 02/251/ 251.htm |
18 | T. W. Krause, C. Mandache, and J. H. V Lefebvre, AIP Conf. Proc 27, 368 (2008). |
19 | W. Youhua, W. Junhua, L. Jiangui, and L. Haohua, IEEE Region 8 Int. Conf. on Computational Technologies in Electrical and Electronics Engineering, SIBRICON, 238 (2008). |
20 | ANASOFT corporation, Maxwell EM V13, www.ansoft.com. |
21 | D. G. Park, C. S. Angani, G. D. Kim, and C. G. Kim IEEE Trans. Magn. 45, 3893 (2009). DOI ScienceOn |
22 | W. H. Ahmed, Annals of Nucl. Energy 37, 598 (2010). DOI ScienceOn |
23 | T. W. Krause, C. Mandache, and J. H. V. Lefebvr, Rev. of Quantitative Nondest. Eval. 27, 368 (2008). |
24 | C. S. Angani, D. G. Park, C. G. Kim, P. Kollu, and Y. M. Cheong, J. Magnetics 15, 204 (2010). DOI ScienceOn |
25 | S. Winnik, European Federation of Corrosion Publications No. 55, Woodhead Publishing Limited, Cambridge England (2008). |
26 | J. C. Moulder, E. Uzal, and J. H. Rose, Rev. Sci. Instrum. 63, 3455 (1992). DOI |