1 |
Onuki, T., Im Jee-won, and Kuwahara, T., IEEE Trans. Magn. 81, 4076 (1997).
|
2 |
I. Kwak, S. Lee, D. Lee, and I. Park, IEEE Trans. Appl. Supercond. 14, 1870 (2004).
DOI
ScienceOn
|
3 |
J. X. Guo, and P. P. Biringer, IEEE Trans. Magn. 27, 4097 (1991).
DOI
ScienceOn
|
4 |
T. Nakata, N. Takahashi, K. Fujiwara, and M. Sakaguchi, IEEE Trans. Magn. 26, 368 (1990).
DOI
ScienceOn
|
5 |
M. Chari, and G. Bedrosian, IEEE Trans. Magn. 23, 3572 (1987).
DOI
|
6 |
Z. Luo, and N. A. Demerdash, IEEE Trans. Magn. 28, 2241 (1992).
DOI
ScienceOn
|
7 |
U. Kim, J. Yang, K. Lee, and D. Yoo, The Trans. KIEE 41, 362 (1992).
|
8 |
S. J. Salon, and J. D'Angelo, IEEE Trans. Magn. 24, 80 (1988).
DOI
ScienceOn
|
9 |
Sheppard J. Salon, Finite element analysis of electrical machines, Kluwer Academic Publishers (1995).
|
10 |
Y. S. Kim, H. S. Choi, I. H. Park, and K. S. Lee, IEEE Trans. Magn. 44, 1290 (2008).
DOI
ScienceOn
|