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http://dx.doi.org/10.4283/JMAG.2007.12.4.141

Microstructure of the Oriented Hexagonal HoMnO3 Thin Films by PLD  

Choi, Dong-Hyeok (Department of Physics, Kookmin University)
Shim, In-Bo (Department of Physics, Kookmin University)
Kouh, Tae-Joon (Department of Physics, Kookmin University)
Kim, Chul-Sung (Department of Physics, Kookmin University)
Publication Information
Journal of Magnetics / v.12, no.4, 2007 , pp. 141-143 More about this Journal
Abstract
We have fabricated (0001) oriented hexagonal $HoMnO_3$ thin films with thickness of 300 nm using Pulsed Laser Deposition (PLD) technique on $Pt(111)/Ti/SiO_2/Si$ substrates. The XRD $\theta-2\theta$ pattern shows only (0002), (0004), and (0008) reflection of a hexagonal phase, and the full width at half maximum (FWHM) of (0004) peak is under $1.6^{\circ}$. The chemical state of Mn from XPS spectra of the films reveals the presence of $Mn^{3+}$ only. The temperature dependence of dielectric constant shows a weak anomaly at magnetic $N\acute{e}el$ temperature $(T_N)$, which is about 70 K.
Keywords
multiferroic; HoMnO3; thin film;
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