[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.4283/JMAG.2004.9.4.121

NiO Thickness Dependences of Perpendicular Magnetic Anisotropy in the [CoFe/Pt] Multilayers

Kim, S.W (Department of Computer and Electronic Physics, Sangji University)
Lee, J.Y (Department of Computer and Electronic Physics, Sangji University)
Lee, S.S (Department of Computer and Electronic Physics, Sangji University)
Hahn, E.J (Department of Physics, Suwon University)
Hwang, D.G (Department of Computer and Electronic Physics, Sangji University)

Publication Information

Journal of Magnetics / v.9, no.4, 2004 , pp. 121-124 More about this Journal

Abstract

NiO thickness dependences of perpendicular magnetic anisotropy (PMA) in the $NiO/[CoFe/Pt]_5$ multilayers for exchange biasing and $[CoFe/Pt]_4/Pt/[CoFe/Pt]_4$ for interlayer exchange coupling were investigated. Perpendicular magnetization curve was obtained by out-of-plane extraordinary Hall measurement. Magnetic force microscopy (MFM) has been used for the investigation of magnetic domains on thin films. We confirmed that the interlayer exchange coupling (IEC) as a function of NiO thickness at room temperature existed with a period of two monolayers.

Keywords

perpendicular magnetic anisotropy (PMA); interlayer exchange coupling (IEC); [CoFe/Pt] multilayers; extraordinary Hall-voltage;

Citations & Related Records

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