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http://dx.doi.org/10.4283/JMAG.2004.9.3.075

High Resolution Magnetic X-ray Microscopy Study of the Magnetization Reversal in CoCrPt Alloy Thin Films  

Im, Mi-Young (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology)
Fischer, Peter (Max-Planck-Institute for Metals Research, Heisenbergstrasse)
Eimiiller, Thomas (Max-Planck-Institute for Metals Research, Heisenbergstrasse)
Shin, Sung-Chul (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology)
Publication Information
Abstract
Magnetic transmission soft X-ray microscopy has been used to study element-specifically the magnetization reversal behavior of ${(Co_{84}Cr_{16})}_{87}Pt_{l3}$ alloy thin films with a lateral resolution of 35 nm. Our results indicate that the magnetization switching is carried out by a random nucleation process that can be attributed to the reversal of individual grains. We found evidence of a large distribution of the switching fields at the nanogranular length scale, which has to be considered seriously for applications of CoCrPt systems as magnetic high density storage materials.
Keywords
nanogranular CoCrPt films; magnetization reversal; magnetic X-ray microscopy; perpendicular magnetic recording;
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