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http://dx.doi.org/10.4283/JMAG.2004.9.2.052

Interlayer and Interfacial Exchange Coupling of IrMn Based MTJ  

Wrona, J. (Department of Electronics, University of Science and Technology)
Stobiecki, T. (Department of Electronics, University of Science and Technolog)
Czapkiewicz, M. (Department of Electronics, University of Science and Technolog)
Kanak, J. (Department of Electronics, University of Science and Technolog)
Rak, R. (Department of Electronics, University of Science and Technolog)
Tsunoda, M. (Tohoku University, Department of Electronic Engineerin)
Takahashi, M. (Tohoku University, Department of Electronic Engineering)
Publication Information
Abstract
As deposited and annealed MTJs with the structure of $Ta(5 nm)/Cu(10 nm)/Ta(5 nm)/Ni_{80}Fe_{20}(2 nm)/Cu(5 nm)/ Ir_{25}Mn_{75}(10 nm)/Co_{70}Fe_{30}(2.5 nm)/Al-O/Co_{70}Fe_{30}(2.5nm)/Ni_{80}Fe_{20}(t)/Ta(5nm)/Ni_{80}Fe_{20}(t)/Ta(5 nm)$, where t=10, 30, 60 and 100 nm were characterized by XRD and magnetic hysteresis loops measurements. The XRD measurements were done in grazing incidence $(GID scan-2{\theta})$ and ${\theta}-2{\theta}$ geometry, by rocking curve $(scan-{\omega})$ and pole figures in order to establish correlation between texture and crystallites size and magnetic parameters of exchange biased and interlayer coupling. The variations of shifting and coercivity field of free and pinned layers after annealing in $300^{\circ}C$ correlate with the improvement of [111] texture and grains size of $Ni_{80}Fe_{20}$ and $Ir_{25}Mn_{75}$ respectively. The exchange biased and the coercivity fields of the pinned layer linearly increased with increasing grain size of $Ir_{25}Mn_{75}$, The reciprocal proportionality between interlayer coupling and coercivity fields of the free layer and grain size of $Ni_{80}Fe_{20}$ was found. The enhancement of interlayer coupling between pinned and free layers, after annealing treatment, indicates on the correlated in-phase roughness of dipolar interacting interfaces due to increase of crystallites size of $Ni_{80}Fe_{20}$.
Keywords
interlayer and interfacial exchange coupling; XRD; MOKE and R-VSM magnetometers;
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