[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.4283/JMAG.2002.7.1.009

Cross Type Domain in Exchange-Coupled NiO/NiFe Bilayers

Hwang, D.G (Department of Computer and Electronic Physics, Sangji University)
Kim, J.K (Dept. of Physics, Dankook University)
Lee, S.S (Department of Computer and Electronic Physics, Sangji University)
Gomez, R.D (Department of Electrical and Computer Engineering, University of Maryland, College Park)

Publication Information

Journal of Magnetics / v.7, no.1, 2002 , pp. 9-13 More about this Journal

Abstract

The dependences of microscopic magnetic domain on film thickness in unidirectional and isotropic exchange-coupled NiO/NiFe bilayers were investigated by magnetic force microscopy to better understand for exchange biasing. As NiO thickness increases, microscopic domain structure of unidirectional biased film changed to smaller and more complicated domains. However, for isotropic-coupled film a new cross type domain appeared with out-of plane magnetization orientation. The density of the cross domain is proportional to exchange biasing fields and the fact that the domain was originated by the strongest exchange coupling region was confirmed from the dynamic domain configuration during a magnetization cycle.

Keywords

Cross Type Domain; Exchange-Coupled;

Citations & Related Records

Reference

1	/ [ Z. Qian;M. T. Kief;P. K. George;J. M. Sivertsen;J. H. Judy ] / J. Appl. Phys. DOI ScienceOn
2	/ [ T. C. Schulthess;W. H. Butler ] / Phys. Rev. Lett.
3	/ [ A. P. Malozemoff ] / J. Appl. Phys. DOI
4	/ [ A. E. Berkowitz;K. Takano ] / Phys. Rev. Lett.
5	/ [ S. Soeya;S. Tadokoro;T. Imagawa;M. Fuyama ] / J. Appl. Phys. DOI ScienceOn
6	/ [ Z. Li;S. Zhang ] / Appl. Phys. Lett. DOI ScienceOn
7	/ [ A. F. Khapikov;J. W. Harrell;H. Fujiwara;C. Hou ] / J. Appl. Phys. DOI ScienceOn
8	M. Prutton, Thin ferromagnetic films (Butterworth, Washington D.C., 1964), p.162
9	/ [ A. P. Malozemoff ] / Phys. Rev.
10	/ [ X. Portier;A. K. Pettiford-LOng;S. Mao;A. M. Goodman;H. Laidly;K. OGrady ] / IEEE Trans. Magn. DOI ScienceOn
11	/ [ Fujiwara(et al.) ] / IEEE Trans. Magn. DOI ScienceOn
12	/ [ M. Prutton ] / Thin ferromagnetic films DOI ScienceOn
13	/ [ D. Mauri;H. C. Siegmann;P. S. Bagus;E. Kay ] / J. Appl. Phys. DOI
14	/ [ V. I. Nikitenko (et al.) ] / Phys. Rev. DOI ScienceOn
15	/ [ J. Ding;J. Zhu ] / J. Appl. Phys. DOI ScienceOn
16	/ [ V. I. Nikitenko (et al.) ] / J. Appl. Phys. DOI ScienceOn
17	/ [ Z. Lie;S. Zhang ] / Appl. Phys. Lett. DOI ScienceOn
18	/ [ M. S. Stiles;R. D. Mcmichael ] / Phys. Rev.
19	/ [ N. C. Koon ] / Phys. Rev. Lett. DOI ScienceOn
20	/ [ Z. Lie;S. Zhang ] / Phys. Rwv.
21	/ [ M. Cartier;S. Auffret;Y. Samson;P. Bayle-guillemaud;B. Dieny ] / J. Mangn. Magn Mater DOI ScienceOn
22	/ [ J. Yu;A. D. Kent;S. S. Parkin ] / J. Appl. Phys. DOI ScienceOn
23	/ [ V. I. Nikitenko (et al.) ] / J. Magn. Magn Mater DOI ScienceOn
24	/ [ H. D. Chopra;D. X. Yang;P. J. Chen;H. J. Brown;L. J. Swartzendruber;W. F. Egelhoff, Jr ] / Phys. Rev. DOI ScienceOn
25	/ [ F. Y. Yang;C. L. Chien ] / Phys. Rev. Lett. DOI ScienceOn
26	/ [ J. C. Wu;H. W. Huang;C. H. Lai;T. H. Wu ] / J. Appl. Phys. DOI ScienceOn
27	/ [ Z. Li;S. Zhang ] / Phys. Rev. DOI ScienceOn
28	/ [ H. D. Chopra;D. X. Yang;P. J. Chen;H. J. Brown;L. J. Swartzendruber;W. F. Egelhoff, Jr ] / J. Appl. Phys. DOI ScienceOn
29	/ [ V. I. Nikitenko (et al.) ] / Phys. Rev. Lett. DOI ScienceOn
30	/ [ G. H. Yu(et al.) ] / J. Magn. Magn. Mater. DOI ScienceOn
31	/ [ M. D. Stiles;R. D. McMichael ] / Phys Rev. DOI ScienceOn
32	/ [ A. E. Berkowitz;K. Takano ] / J. Mag. Mag.Mat. DOI ScienceOn