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Implementation of a Piezoresistive MEMS Cantilever for Nanoscale Force Measurement in Micro/Nano Robotic Applications  

Kim, Deok-Ho (Microsystem Research Center, Korea Institute of Science and Technology)
Kim, Byungkyu (Microsystem Research Center, Korea Institute of Science and Technology)
Park, Jong-Oh (Microsystem Research Center, Korea Institute of Science and Technology)
Publication Information
Journal of Mechanical Science and Technology / v.18, no.5, 2004 , pp. 789-797 More about this Journal
Abstract
The nanoscale sensing and manipulation have become a challenging issue in micro/nano-robotic applications. In particular, a feedback sensor-based manipulation is necessary for realizing an efficient and reliable handling of particles under uncertain environment in a micro/nano scale. This paper presents a piezoresistive MEMS cantilever for nanoscale force measurement in micro robotics. A piezoresistive MEMS cantilever enables sensing of gripping and contact forces in nanonewton resolution by measuring changes in the stress-induced electrical resistances. The calibration of a piezoresistive MEMS cantilever is experimentally carried out. In addition, as part of the work on nanomanipulation with a piezoresistive MEMS cantilever, the analysis on the interaction forces between a tip and a material, and the associated manipulation strategies are investigated. Experiments and simulations show that a piezoresistive MEMS cantilever integrated into a micro robotic system can be effectively used in nanoscale force measurements and a sensor-based manipulation.
Keywords
Piezoresistive MEMS Cantilever; Atomic Force Microscope (AFM); Microrobotics; Micro Force Sensing; Van der Waals Force; Micro/Nano-manipulation;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
연도 인용수 순위
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