An AFM-based Edge Profile Measuring Instrument for Diamond Cutting Tools
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Asai, Takemi
(Department of Nanomechanics, School of Engineering, Tohoku University)
Motoki, Takenori (Department of Nanomechanics, School of Engineering, Tohoku University) Gao, Wei (Department of Nanomechanics, School of Engineering, Tohoku University) Ju, Bing-Feng (Department of Nanomechanics, School of Engineering, Tohoku University) Kiyono, Satoshi (Department of Nanomechanics, School of Engineering, Tohoku University) |
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2 | Asai, S., Taguchi, Y., Horio, K. and Kasai, T., 'Measuring the very small cutting edge radius for a diamond cutting tool using a new type of SEM having two detectors,' CIRP Annals, Vol. 39, pp. 85-88, 1990 DOI ScienceOn |
3 | Soares, S., 'Nanometer edge and surface imaging using optical scatter,' Precision Engineering, Vol. 27, pp. 99-102, 2003 DOI ScienceOn |
4 | Gao, W., Motoki, T. and Kiyono, S., 'Nanometer edge profile measurement of diamond cutting tools by atomic force microscope with optical alignment sensor,' Precision Engineering, Vol. 30, pp.396-405, 2006 DOI ScienceOn |
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