Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development |
Sato, Masayuki
(Genesis Technology Inc., presently Taiyo Yuden Corp.)
Wakamatsu, Hiroki (Genesis Technology Inc., presently Oki Engineering Co.) Arai, Masayuki (Tokyo Metropolitan University) Ichino, Kenichi (Tokyo Metropolitan University) Iwasaki, Kazuhiko (Tokyo Metropolitan University) Asakawa, Takeshi (Tokai University) |
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