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Morphology and Properties of Polyacrylonitrile/Single Wall Carbon Nanotube Composite Films  

Kim, Seong Hoon (School of Advanced Materials and System Engineering, Kumoh National Institute of Technology)
Min, Byung Ghyl (School of Advanced Materials and System Engineering, Kumoh National Institute of Technology)
Lee, Sang Cheol (School of Advanced Materials and System Engineering, Kumoh National Institute of Technology)
Park, Sung Bum (Department of Physics, Kumoh National Institute of Technology)
Lee, Tae Dong (Department of Physics, Kumoh National Institute of Technology)
Park, Min (Polymer Hybrid Research Center, Korea Institute of Science and Technology)
Kumar, Satish (School of Polymer, Textile and Fiber Engineering, Georgia Institute of Technology)
Publication Information
Fibers and Polymers / v.5, no.3, 2004 , pp. 198-203 More about this Journal
Abstract
Composite films were prepared by casting the solution of polyacrylonitrile (PAN) and single wall nanotube (SWNT) in DMF subsequent to sonication. The SWNTs in the films are well dispersed as ropes with 20-30 nm thickness. Moreover, AFM surface image of the composite film displays an interwoven fibrous structure of nanotubes which may give rise to conductive passways and lead to high conductivity. The polarized Raman spectroscopy is an ideal characterization technique for identification and the orientation study of SWNT. The well-defined G-peak intensity at 1580 $cm^{-1}$shows a dependency on the draw ratio under cross-Nicol. The degree of nanotube orientation in the drawn film was measurable from the sine curve obtained by rotating the drawn film on the plane of cross-Nicol of polarized Raman microscope. The threshold loading of SWNT for electrical conductivity in PAN is found to be lower than 1 wt% in the composite film. The electrical conductivity of the SWNT/PAN composite film decreased with increasing of draw ratio due to the collapse of the interwoven fibrous network of the nanotubes with uniaxial orientation.
Keywords
SWNT; Polyacrylonitrile; Nanocomposite; AFM; Raman spectroscopy;
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