Browse > Article
http://dx.doi.org/10.5391/IJFIS.2002.2.1.089

Wavelet Analysis to Real-Time Fabric Defects Detection in Weaving processes  

Kim, Sung-Shin (School of Electrical and Computer Engineering, Pusan Nation University)
Bae, Hyeon (School of Electrical and Computer Engineering, Pusan Nation University)
Jung, Jae-Ryong (School of Electrical and Computer Engineering, Pusan Nation University)
Vachtsevanos, George J. (School of Electrical and Computer Engineering, Georgi Institute of Technology)
Publication Information
International Journal of Fuzzy Logic and Intelligent Systems / v.2, no.1, 2002 , pp. 89-93 More about this Journal
Abstract
This paper introduces a vision-based on-line fabric inspection methodology of woven textile fabrics. Current procedure for determination of fabric defects in the textile industry is performed by human in the off-line stage. The advantage of the on-line inspection system is not only defect detection and identification, but also 벼ality improvement by a feedback control loop to adjust set-points. The proposed inspection system consists of hardware and software components. The hardware components consist of CCD array cameras, a frame grabber and appropriate illumination. The software routines capitalize upon vertical and horizontal scanning algorithms characteristic of a particular deflect. The signal to noise ratio (SNR) calculation based on the results of the wavelet transform is performed to measure any deflects. The defect declaration is carried out employing SNR and scanning methods. Test results from different types of defect and different style of fabric demonstrate the effectiveness of the proposed inspection system.
Keywords
Defects detection; fabric inspection; wavelet transform; computer vision; process control;
Citations & Related Records
연도 인용수 순위
  • Reference
1 David M. Himmelblau, Applied Nonlinear Programming. McGraw-Hill, 1972
2 G. Vachtsevanos, J. L. Dorrity, A. Kumar, and S. Kim,'Advanced application of statistical and fuzzy control to textile processes,' IEEE Trans. on Industry Apptications, vol. 30, no. 3, pp. 510-516, May-June 1994   DOI   ScienceOn
3 S. Kim, G. Vachtsevanos, and J. L. Dorrity, 'An intelli-gent approach to integration of textile processes,' ASME '96 Intl. Congress & Exposition, Atlanta, GA, pp. 73-79, Nov. 18-22, 1996
4 W. J. Jasper, S. J. Garnier, and H. Potlapalli, 'Texture characterization and defect detection using adaptive wavelets,' Optical Engineering, vol. 35, no. 11, pp. 3140-9, Nov. 1996   DOI   ScienceOn
5 S. Mallat, 'Wavelets for a vision,' Proceedings of the IEEE, vol. 84, no. 4 pp. 604-14, April 1996   DOI   ScienceOn
6 G. Strang and T. Nguyen, Wavelets and filter banks. Wellesley-Cambridge Press, 1996
7 T. Masters, Signal and Image Processing with Neural Networks. John Wiley and Sons, Inc., 1994
8 O. Rioul and M. Vetterli, 'Wavelet and Signal Processing,' IEEE Signal Processing Magazine, pp. 14-34, October 1991