Calibration and Uncertainty Analysis of Sample-Time Error on High Jitter of Samplers |
Cho, Chihyun
(Center for Electromagnetic Metrology, Korea Research Institute of Standard and Science)
Lee, Joo-Gwang (Center for Electromagnetic Metrology, Korea Research Institute of Standard and Science) Kang, Tae-Weon (Center for Electromagnetic Metrology, Korea Research Institute of Standard and Science) Kang, No-Weon (Center for Electromagnetic Metrology, Korea Research Institute of Standard and Science) |
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