Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range |
Kang, Jin-Seob
(Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science (KRISS))
Kim, Jeong-Hwan (Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science (KRISS)) Kang, Kwang Yong (Panoptics) Yoon, Dae Hwan (National Radio Research Agency (RRA)) Park, Sung Won (National Radio Research Agency (RRA)) |
1 | F. Sagnard, F. Bentabet, and C. Vignat, "In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (Part II)," IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 3, pp. 1274-1282, 2005. DOI |
2 | M. Klenner, C. Zech, A. Hulsmann, J. Kuhn, M. Schlechtweg, and O. Ambacher, "Spectroscopic measurement of material properties using an improved millimeter-wave ellipsometer based on metallic substrates," IEEE Transactions on Instrumentation and Measurement, vol. 65, no. 11, pp. 2551-2559, 2016. DOI |
3 | IEEE 802.15 WPAN Terahertz Interest Group (IGthz) [Online]. Available: http://www.ieee802.org/15/pub/IGthz-OLD.html. |
4 | J. S. Kang, J. H. Kim, K. Y. Kang, D. H. Yoon, and S. W. Park, "Specular reflectance measurement of dielectric plates in 110-325 GHz frequency range," in Proceedings of the 39th Annual Meeting and Symposium of the Antenna Measurement Techniques Association (AMTA), Atlanta, GA, 2017. |
5 | M. H. Umari, D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, "A free-space bistatic calibration technique for the measurement of parallel and perpendicular reflection coefficients of planar samples," IEEE Transactions on Instrumentation and Measurement, vol. 40, no. 1, pp. 19-24, 1991. DOI |
6 | X. Faget, N. Mallejac, and A. Litman, "Bistatic free-space measurements of magneto-dielectric materials and comparison with numerical models," in Proceedings of the 2016 URSI International Symposium on Electromagnetic Theory (EMTS), Espoo, Finland, 2016, pp. 404-406. |
7 | C. A. Balanis, Modern Antenna Handbook. New York, NY: John Wiley & Sons, 2008. |
8 | T. M. Nguyen and J. Y. Chung, "RF conductivity measurement of conductive Zell fabric," Journal of Electromagnetic Engineering and Science, vol. 16, no. 1, pp. 24-28, 2016. DOI |
9 | G. Y. Kim and B. S. Lee, "Synthesis of bulk medium with negative permeability using ring resonators," Journal of Electromagnetic Engineering and Science, vol. 16, no. 2, pp. 67-73, 2016. DOI |
10 | B. Komiyama, M. Kiyokawa, and T. Matsui, "Open resonator for precision dielectric measurements in the 100 GHz band," IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 10, pp. 1792-1796, 1991. DOI |
11 | S. N. Dudorov, D. V. Lioubtchenko, J. A. Mallat, and A. V. Raisanen, "Differential open resonator method for permittivity measurements of thin dielectric film on substrate," IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 5, pp. 1916-1920, 2005. DOI |
12 | J. S. Kang, J. H. Kim, C. H. Cho, and D. C. Kim, "W-band permittivity measurements using a free-space material measurement technique," The Journal of Korean Institute of Electromagnetic Engineering and Science, vol. 24, no. 3, pp. 253-258, 2013. DOI |
13 | D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, "Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies," IEEE Transactions on Instrumentation and Measurement, vol. 39, no. 2, pp. 387-394, 1990. DOI |
14 | D. Bourreau, A. Peden, and S. Le Maguer, "A quasi-optical free-space measurement setup without time-domain gating for material characterization in the W-band," IEEE Transactions on Instrumentation and Measurement, vol. 55, no. 6, pp. 2022-2028, 2006. DOI |
15 | A. Kazemipour, M. Hudlicka, S. K. Yee, M. A. Salhi, D. Allal, T. Kleine-Ostmann, and T. Schrader, "Design and calibration of a compact quasi-optical system for material characterization in millimeter/submillimeter wave domain," IEEE Transactions on Instrumentation and Measurement, vol. 64, no. 6, pp. 1438-1445, 2015. DOI |
16 | J. S. Kang, J. H. Kim, and J. I. Park, "Reduction of edge diffraction effects of MUT holder using EM absorber in W-band free-space material measurements," in Proceedings of the 2016 International Symposium on Antennas and Propagation (ISAP), Okinawa, Japan, 2016, pp. 936-937. |
17 | S. Iyer, C. C. Cheng, C. Kim, and A. Abbaspour-Tamijani, "Compact Gaussian beam system for S-parameter characterization of planar structures at millimeter-wave frequencies," IEEE Transactions on Antennas and Propagation, vol. 59, no. 9, pp. 2437-2444, 2010. |
18 | F. Sagnard, F. Bentabet, and C. Vignat, "In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (Part I)," IEEE Transactions on Instrumentation and Measurement, vol. 54, no. 3, pp. 1266-1273, 2005. DOI |
![]() |