Investigation of Relation between EFTB Test and RF Conductive Immunity Test Using BER and Baseband Signal |
Kuwabara, Nobuo
(Dept. of Electrical Engineering and Electronics, Kyushu Institute of Technology)
Irie, Yasuhiro (Dept. of Electrical Engineering and Electronics, Kyushu Institute of Technology) Hirasawa, Norihito (Energy and Environment Systems Laboratories, Nippon Telegraph and Telephone Corporation(NTT)) Akiyama, Yoshiharu (Energy and Environment Systems Laboratories, Nippon Telegraph and Telephone Corporation(NTT)) |
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