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Reduction Characteristics of Electromagnetic Penetration through Narrow Slots in Conducting Screen by Loading Parallel Wire Arrays  

Kim Ki-Chai (Department of Electrical Engineering, College of Engineering, Yeongnam University)
Lim Sung-Min (TECH. Center, SL Corporation)
Publication Information
Journal of electromagnetic engineering and science / v.6, no.2, 2006 , pp. 123-129 More about this Journal
Abstract
This paper presents a method of reducing penetration of penetrated electromagnetic fields through a narrow slot with parallel wire arrays in a planar conducting screen of infinite extent. An integral equation for the aperture electric field on the narrow slot is derived and solved by applying Galerkin's method of moments. When a plane wave is excited to the narrow slot, the aperture electric field is easily controlled by the parallel wire arrays connected on the slot and therefore the magnitude of the penetrated electric field is effectively reduced by loading the parallel wire arrays. The numerical results show that the magnitude of the penetrated electromagnetic field can be effectively reduced by installing the parallel wire arrays on the slot. The results of the calculated penetration electric fields are in good agreement with that of the measured results.
Keywords
Narrow Slot; Reduction of Electromagnetic Penetration; N-Wire Parallel Arrays;
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