Browse > Article
http://dx.doi.org/10.5370/JEET.2018.13.4.1752

Implementing a Dielectric Recovery Strength Measuring System for Molded Case Circuit Breakers  

Cho, Young-Maan (Dept. of Electrical Engineering, Hanyang University)
Rhee, Jae-ho (Dept. of Electrical Engineering, Hanyang University)
Baek, Ji-Eun (Dept. of Electrical Engineering, Hanyang University)
Ko, Kwang-Cheol (Dept. of Electrical Engineering, Hanyang University)
Publication Information
Journal of Electrical Engineering and Technology / v.13, no.4, 2018 , pp. 1752-1758 More about this Journal
Abstract
In a low-voltage distribution system, the molded case circuit breaker (MCCB) is a widely used device to protect loads by interrupting over-current; however the hot gas generated from the arc discharge in the interrupting process depletes the dielectric recovery strength between electrodes and leads to re-ignition after current-zero. Even though the circuit breaker is ordinarily tripped and successfully interrupts the over-current, the re-ignition causes the over-current to flow to the load again, which carries over the failure interruption. Therefore, it is necessary to understand the dielectric recovery process and the dielectric recovery voltage of the MCCB. To determine these characteristics, a measuring system comprised of the experimental circuit and source is implemented to apply controllable recovery voltage and over-current. By changing the controllable recovery voltage, in this work, re-ignition is driven repeatedly to obtain the dielectric recovery voltage V-t curve, which is used to analyze the dielectric recovery strength of the MCCB. A measuring system and an evaluation technique for the dielectric recovery strength of the MCCB are described. By using this system and method, the measurement to find out the dielectric recovery characteristics after current-zero for ready-made products is done and it is confirmed that which internal structure of the MCCB affects the dielectric recovery characteristics.
Keywords
Dielectric recovery strength; Implementation of a measuring system; Molded case circuit breaker (MCCB); Current limitation effect;
Citations & Related Records
연도 인용수 순위
  • Reference
1 K. Tsuruta, I. Takahashi, Y. Kanzaki, T. Ojima, Y. Komuro, "Experimental study of the voltage recovery characteristics of small air gaps," IEEE Trans. Plasma Sci., Vol.17, No.3, pp. 560-564, 1989.   DOI
2 E. F. J. Huber, K. D. Weltmann, K. Froehlich, "Influence of interrupted current amplitude on the post-arc current and gap recovery after current zeroexperiment and simulation," IEEE Trans. Plasma Sci. vol. 27, no. 4, pp. 930-937, 2002.
3 C. Degui, L. I. Xingwen. "Measurement of the dielectric recovery strength and reignition of AC contactors," IEICE Trans. electron., vol. 88, no. 8, pp. 1641-1646, 2005.
4 John J. Shea, "The influence of arc chamber wall material on arc gap dielectric recovery voltage," Proc. Forty-Sixth IEEE Holm Conference on Electrical Contacts, 2000.
5 A. Lee, J. V. R. Heberlein, T. N. Meyer., "Highcurrent arc gap with ablative wall: dielectric recovery and wall-contact interaction," IEEE Trans. Compon. Hybrids, Manufacturing Technol. vol. 8, no. 1 pp. 129-134, 1985.   DOI
6 John J. Shea, "The influence of arc chamber wall material on arc gap dielectric recovery voltage," IEEE Trans. Compon. Packag. Technol., vol. 24, no. 3, pp. 342-348, 2001.   DOI
7 A. Shemshadi, A. Salavati, A. Akbari, S. Mohammad Taghi Bathaee, "Dielectric recovery process in vacuum interrupters regarding to contact materials during post arc interval," IEEE Trans. Dielectr. Electr. Insul, vol. 22, no. 5, pp. 3059-3064, 2015.   DOI
8 H. Nagaoka, "The inductance coefficients of solenoids," Journal of the College of Sci., vol. 27, no. 3, 31, 1909.
9 J. Li, Z. Guan, L. Wang, H. Yang, J. Zhou, "An experimental study of AC arc propagation over a contaminated surface," IEEE Trans. Dielectr. Electr. Insul, vol. 19, no. 4, pp. 1360-1368, 2012.   DOI
10 M. K. Zadeh, V. Hinrichsen, R. Smeets, A. Lawall, "Field emission currents in vacuum breakers after capacitive switching," IEEE Trans. Dielectr. Electr. Insul, vol. 18, no. 3, pp. 910-917, 2011   DOI
11 J. Zhang, E. J. M. van Heesch, F. J. C. M. Beckers, A. J. M. Pemen, R. P. P. Smeets, T. Namihira, A. H. Markosyan, "Breakdown strength and dielectric recovery in a high pressure supercritical nitrogen switch," IEEE Trans. Dielectr. Electr. Insul, vol. 22, no. 4, pp. 1823-1832, 2015.   DOI
12 Z. Wang, G. Yingsan, L. Zhiyuan, "Stepwise behavior of free recovery processes after diffused vacuum arc extinction," IEEE Trans. Dielectr. Electr. Insul, vol. 19, no. 2, pp. 582-590, 2012.   DOI