[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.5370/JEET.2017.12.4.1376

Estimation of Voltage Swell Frequency Caused by Asymmetrical Faults

Park, Chang-Hyun (Dept. of Electrical Engineering, Pukyong National University)

Publication Information

Journal of Electrical Engineering and Technology / v.12, no.4, 2017 , pp. 1376-1385 More about this Journal

Abstract

This paper proposes a method for estimating the expected frequency of voltage swells caused by asymmetrical faults in a power system. Although voltage swell is less common than voltage sag, repeated swells can have severe destructive impact on sensitive equipment. It is essential to understand system performance related to voltage swells for finding optimal countermeasures. An expected swell frequency at a sensitive load terminal can be estimated based on the concept of an area of vulnerability (AOV) and long-term system fault data. This paper describes an effective method for calculating an AOV to voltage swells. Interval estimation for an expected swell frequency is also presented for effective understanding of system performance. The proposed method provides long-term performance evaluation of the frequency and degree of voltage swell occurrences.

Keywords

Asymmetrical faults; Interval estimation; Power quality; Single line to ground fault; Voltage swells;

Citations & Related Records

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