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http://dx.doi.org/10.5370/JEET.2015.10.1.308

Inverse Scattering of Two-Dimensional Objects Using Linear Sampling Method and Adjoint Sensitivity Analysis  

Eskandari, Ahmadreza (Department of Electrical Engineering, College of Engineering, East Tehran Branch, Islamic Azad University)
Eskandari, Mohammad Reza (Electrical and Computer Engineering Department, Isfahan University of Technology)
Publication Information
Journal of Electrical Engineering and Technology / v.10, no.1, 2015 , pp. 308-313 More about this Journal
Abstract
This paper describes a technique for complete identification of a two-dimensional scattering object and multiple objects immersed in air using microwaves where the scatterers are assumed to be a homogenous dielectric medium. The employed technique consists of initially retrieving the shape and position of the scattering object using a linear sampling method and then determining the electric permittivity and conductivity of the scatterer using adjoint sensitivity analysis. Incident waves are assumed to be TM (Transverse Magnetic) plane waves. This inversion algorithm results in high computational speed and efficiency, and it can be generalized for any scatterer structure. Also, this method is robust with respect to noise. The numerical results clearly show that this hybrid approach provides accurate reconstructions of various objects.
Keywords
Inverse scattering; Microwave imaging; Linear Sampling Method (LSM); Adjoint Sensitivity Analysis (ASA);
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