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http://dx.doi.org/10.5370/JEET.2013.8.2.331

A New Sensitivity-Based Reliability Calculation Algorithm in the Optimal Design of Electromagnetic Devices  

Ren, Ziyan (College of Electrical and Computer Engineering, Chungbuk National University)
Zhang, Dianhai (College of Electrical and Computer Engineering, Chungbuk National University)
Koh, Chang Seop (College of Electrical and Computer Engineering, Chungbuk National University)
Publication Information
Journal of Electrical Engineering and Technology / v.8, no.2, 2013 , pp. 331-338 More about this Journal
Abstract
A new reliability calculation method is proposed based on design sensitivity analysis by the finite element method for nonlinear performance constraints in the optimal design of electromagnetic devices. In the proposed method, the reliability of a given design is calculated by using the Monte Carlo simulation (MCS) method after approximating a constraint function to a linear one in the confidence interval with the help of its sensitivity information. The validity and numerical efficiency of the proposed sensitivity-assisted MCS method are investigated by comparing its numerical results with those obtained by using the conventional MCS method and the first-order reliability method for analytic functions and the TEAM Workshop Problem 22.
Keywords
Design sensitivity analysis; Finite element method; First-order reliability method; Monte Carlo simulation; Reliability index approach;
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