Impact of Interface Charges on the Transient Characteristics of 4H-SiC DMOSFETs |
Kang, Min-Seok
(Dept. of Electronic Materials Engineering, Kwangwoon University)
Bahng, Wook (Korea Electrotechnology Research Institute, Power Semiconductor Research Group) Kim, Nam-Kyun (Korea Electrotechnology Research Institute, Power Semiconductor Research Group) Ha, Jae-Geun (Dept. of Electronic Materials Engineering, Kwangwoon University) Koh, Jung-Hyuk (Dept. of Electronic Materials Engineering, Kwangwoon University) Koo, Sang-Mo (Dept. of Electronic Materials Engineering, Kwangwoon University) |
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