A Novel High Performance Scan Architecture with Dmuxed Scan Flip-Flop (DSF) for Low Shift Power Scan Testing
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Kim, Jung-Tae
(Leading Product PE/TEST Group, System LSI Division, Samsung Electronics, Korea and School of Information and Communication Engineering, Sungkyunkwan University)
Kim, In-Soo (School of Information and Communication Engineering, Sungkyunkwan University) Lee, Keon-Ho (School of Information and Communication Engineering, Sungkyunkwan University) Kim, Yong-Hyun (School of Information and Communication Engineering, Sungkyunkwan University) Baek, Chul-Ki (School of Information and Communication Engineering, Sungkyunkwan University) Lee, Kyu-Taek (Leading Product PE/TEST Group, System LSI Division, Samsung Electronics) Min, Hyoung-Bok (School of Information and Communication Engineering, Sungkyunkwan University) |
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