1 |
T.J. Gallaghe, A.J. Pearmain, 'HIGH VOLTAGE Measerement, Testing and Design', JOHN WILEY&SONS Ltd., pp. 66-72, 1983
|
2 |
J.S. Barrett, M.A. Green; A STATISTICAL METHOD FOR EVALUATING ELECTRICAL FAILURES; IEEE Tran. Power Delivery, Vol. 9, No. 3, pp. 1524-1530, 1994
DOI
ScienceOn
|
3 |
Wenyuan Li; Evaluation Mean Life of Power System Equipment with Limited End-of-Life Failure Data; IEEE Tran. Power Systems, Vol. 19, No. 1, pp. 236- 242, 2004
DOI
ScienceOn
|
4 |
Wendai Wang and Dimitri B. Kececioglu; Fitting the Weibull Log-Linear Model to Accelerated Life-Test Data; IEEE Tran. Reliability, Vol. 49, No. 2, pp. 217- 223, 2000
DOI
ScienceOn
|
5 |
Kuniharu IMAI, 'Statistical Analysis of Tree Propagation from a Simulated Tree Channel with Weibull Distribution and Influence of Temperature on it' T.IEE Japan, Vol. 120-A, No. 5, pp. 645-650, 2000
|
6 |
Kuniharu IMAI, 'Relationship between Diameter of Simulated Tree Channel and Tree Propagation from its Tip', J. Inst. Electrostate. Japan, Vol. 26, No. 2, pp.84-90, 2002
|
7 |
Imai. K, Ito.K, Shimizu.N, Nawata.M, 'Influence of Polymer Structure on Tree Growth from a Simulated Tree Channel', 2000 Conference on Electrical Insulation and Dielectric, Vol. 1, pp. 337-340, 2000
|
8 |
Wu E.Y, Sune.J, Lai W, 'On the Weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination.', IEEE Transactions on Electron Devices, Vol. 49, No. 12, pp. 2141-2150, 2002
DOI
ScienceOn
|
9 |
L.A. Dissado, J.C. Fothergill; Electrical Degradation and Breakdown in Polymers; Peter Peregirinus Ltd. pp. 117-198, 1987
|