[KSCI] Korea Science Citation Index Service

Theory of Thin Sample z-scan of a New Class of Nonlinear Materials

Kim, Yong-K. (Dept. of Electrical/Electronics, Information Engineering, Wonkwang University)

Publication Information

KIEE International Transactions on Electrophysics and Applications / v.3C, no.6, 2003 , pp. 246-251 More about this Journal

Abstract

We report the theory of thin-sample Z -scan for materials, viz. diffusion-dominated photorefractives, having a nonlinearly induced phase that may be proportional to the spatial derivative of the intensity profile. The on-axis far-field intensity is approximately an even function of the scan distance on different positive and negative values for phase shift $\Delta$ $\Phi$ $_{o}$ . In case of positive phase shift, the Z -scan graph shows a minimum and two maxima, while for the negative value, only one minimum is observed. The fact is that far-field beam profiles display beam distortion and shift of the peak as compared with Kerr-type or photovoltaic nonlinearities.s.

Keywords

Z-scan; thin-sample; nonlinearity; diffusion-dominated photorefractive; photovoltaic;

Citations & Related Records

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