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Electrical and Photoluminescence Characteristics of Nanocrystalline Silicon-Oxygen Superlattice for Silicon on Insulator Application  

Seo, Yong-Jin (Department of Electrical Engineering, Daebul University)
Publication Information
KIEE International Transactions on Electrophysics and Applications / v.2C, no.5, 2002 , pp. 258-261 More about this Journal
Abstract
Electrical forming dependent current-voltage (I-V) and numerically derived differential conductance(dI／dV) characteristics have been presented in the multi-layer nano-crystalline silicon／oxygen (no-Si／O) superlattice. Distinct staircase-like features, indicating the presence of resonant tunnel barriers, are clearly observed in the dc I-V characteristics. Also, all samples showed a continuous change in current and zero conductivity around OV corresponding to the Coulomb blockade in the calculated dI／dV-V curve. Also, Ra-man scattering measurement showed the presence of a nano-crystalline Si structure. This result becomes a step in the right direction for the fabrication of silicon-based optoelectronic and quantum devices as well as for the replacement of silicon-on-insulator (SOI) in high speed and low power silicon MOSFET devices of the future.
Keywords
current-voltage (I-V); differential conductance-voltage (dI／dV-V); photoluminescence (PL);
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1 R. Tsu, Nature, Vol. 364, p.9, 1993   DOI
2 Y. J. Seo, and R. Tsu, Jpn. J. Appl. Phys., Vol. 40, p.4799, 2001
3 Z. H. Lu, D. J. Lockwood, and J. M. Barlbeau, Nature, Vol. 378, p.258, 1995
4 R. Tsu, A. Filios, and Q. Zhang, Advances in Science and Technology 27, Techna. SrI., Vol. 55, p.55, 1999
5 L. Esaki and R. Tsu, IBM 1. Res. and Develop., Vol. 14, p.61, 1970
6 Q. Y. Ye, R. Tsu, and E. H. Nicollian, Phys. Rev., Vol. B44, p.1806, 1991
7 R. Tsu, Q. Y. Ye, and E. H. Nicollian, SPIE., Vol. 1361, p.232, 1990
8 E. H. Nicollian and R. Tsu, J. Appl. Phys., Vol. 74, p.4020, 1993
9 R. Tsu, A. Filios, C. Lofgren, K. Dovidenko, and C. G. Wang, Elecctrochem and Solid State Lett., Vol. 1(2), p.80, 1998
10 R. Tsu and L. Esaki, Appl Phys. Lett., Vol. 22, p.562, 1973
11 S. Y. Chou and A. E. Gordon, Appl. Phys. Lett., Vol. 60, p.1827, 1992
12 L. T. Canham, Appl. Phys. Lett., Vol. 57, p.1046, 1990
13 R. Tsu, E. H. Nicollian, and A. Reisman, Appl. Phys. Lett., Vol. 55, p.1897, 1989
14 Y. J. Seo, J. C. Lofgrene, and R. Tsu, Appl. Phys. Lett., Vol. 79, p.788, 2001