Evaluation of STS 430 and STS 444 for SOFC Interconnect Applications |
Kim, S.H.
(Department of Materials Science and Engineering, Korea University)
Huh, J.Y. (Department of Materials Science and Engineering, Korea University) Jun, J.H. (New Materials & Components Research Center, Research Institute of Industrial Science and Technology) Kim, D.H. (New Materials & Components Research Center, Research Institute of Industrial Science and Technology) Jun, J.H. (New Materials & Components Research Center, Research Institute of Industrial Science and Technology) |
1 | T. Brylewski, M. Narum, T. Maruyama, and K. Przybylski, Solid State Ionics, 143, 131 (2001) DOI ScienceOn |
2 | Z. Yang, J. S. Hardy, M. S. Walker, G. Xia, S. P. Simner, and J. W. Stevenson, J Electrochem. Soc., 151, A1825 (2004) |
3 | H. Tu and U. Stimming, J Power Sources, 127, 284 (2004) |
4 | Z. Yang, K. S. Weil, D. M. Paxton, and J. W. Stevenson, J Electrochem. Soc., 150, A1188 (2003) DOI |
5 | T. Horita, Y. Xiong, K. Yamaji, N. Sakai, and H. Yokokawa, J Electrochem. Soc., 150, A243 (2003) DOI |
6 | W. Z. Zhu and S. C. Deevi, Mater. Sci. Eng., 38, 957 (2003) |
7 | X. Chen, P. Y. Hou, C. P. Jacobson, S. J. Visco, and L. C. De Jonghe, Solid State Ionics, 176, 425 (2005) |
8 | K. Huang, P. Y. Hou, and J. B. Goodenough, Solid State Ionics, 129, 237 (2000) |
9 | W. Qu, L. Jian, D. G. Ivey, and J. M. Hill, J Power Sources, 157, 335 (2006) |
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