The Growth Mechanism and Mitigation Method of Sn Whiskers
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Oh, Chul-Min
(전자부품연구원)
Jung, Jae-Sung (전자부품연구원) Ku, Ki-Young (국방기술품질원) Yoon, Young-Ho (국방기술품질원) Hwang, Un-Hee (국방기술품질원) Hong, Won-Sik (전자부품연구원) |
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37 | Sudarshan Lal and Thomas D. Moyer : Role of Intrinsic Stresses in the Phenomena of Tin Whiskers in Electrical Connectors, IEEE Trans. on Electronics Packaging Manufacturing, 28-1 (2005), 63-74 DOI ScienceOn |
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