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Aging Characteristic of Shear Strength in Micro Solder Bump  

김경섭 (여주대학 전자학과)
유정희 (한국전자통신연구원)
선용빈 (경기대학교 산업정보대학원)
Publication Information
Journal of Welding and Joining / v.20, no.5, 2002 , pp. 72-77 More about this Journal
Abstract
Flip-chip interconnection that uses solder bump is an essential technology to improve the performance of microelectronics which require higher working speed, higher density, and smaller size. In this paper, the shear strength of Cr/Cr-Cu/Cu UBM structure of the high-melting solder b01p and that of low-melting solder bump after aging is evaluated. Observe intermetallic compound and bump joint condition at the interface between solder and UBM by SEM and TEM. And analyze the shear load concentrated to bump applying finite element analysis. As a result of experiment, the maximum shear strength of Sn-97wt%Pb which was treated 900 hrs aging has been decreased as 25% and Sn-37wt%Pb sample has been decreased as 20%. By the aging process, the growth of $Cu_6Sn_5$ and $Cu_3Sn$ is ascertained. And the tendency of crack path movement that is interior of a solder to intermetallic compound interface is found.
Keywords
Solder bump; Shear strength; Aging; Intermetallic compound; Reflow soldering;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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[] / International Technology Readmap for Semiconductor(1999 edition)