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Electronic Properties of MIM Structure Organic Thin-films that Manufacture by LB method  

Choi, Young-Il (Dept. of Mechatronics, Chosun College of Science & Technology)
Lee, Kyung-Sup (Dept. of Electrical Eng., Dongshin University)
Lim, Jung-Yeol (Dept. of Digital information, Nambu University)
Song, Jin-Won (Dept. of Nanomecanical System Research Center, Korea Institute of Machinery & Materials)
Publication Information
전자공학회논문지 IE / v.43, no.4, 2006 , pp. 99-104 More about this Journal
Abstract
The Langmuir-Blodgett(LB) technique has attracted considerable interest in the fabrication of electrical and electronic devices. Maxwell displacement current (MDC) measurement has been employed to study the dielectric property of Langmuir-films. MDC flowing across monolayers is analyzed using a rod-like molecular model. A linear relationship between the monolayer compression speed u and the molecular area Am. Compression speed a was about 30, 40, 50mm/min. Langmuir-Blodgett(LB)layers of Arachidic acid deposited by LB method were deposited onto slide glass as Y-type film. The structure of manufactured device is Au/Arachidic acid/Al, the number of accumulated layers are 9$\sim$21. Also, we then examined of the Metal-Insulator-Metal(MIM) device by means of I-V. The I-V characteristics of the device are measured from -3 to +3[V]. The insulation property of a thin film is better as the distance between electrodes is larger.
Keywords
Maxwell displacement current (MDC); Langmuir-films; MIM device;
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