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Electrical properties of the lower dielectrics layer of PDP required high reflectance and low dielectric constants  

Kwon, Soon-Seok (Cheonan National Technical College, Department of Electrical Engineering)
Ryu, Jang-Ryeol (Kongju National University, Division of Electrical & Electronic Engineering)
Publication Information
전자공학회논문지 IE / v.43, no.4, 2006 , pp. 8-12 More about this Journal
Abstract
In this paper, reflectance and the dielectric characteristics for $P_2O_5$-ZnO-BaO system and $SiO_2-ZnO-B_2O_3$ system have been investigated as a function of contents of $TiO_2$. The reflectance was decreased with increasing the contents of $TiO_2$ contents, and the reflectance of $P_2O_5$-ZnO-BaO system was lowered than that of $SiO_2-ZnO-B_2O_3$ system. The dielectric constant of $P_2O_5$-ZnO-BaO system was higher than $SiO_2-ZnO-B_2O_3$ system, and the dielectric constant in the both system was increased with increasing of $TiO_2$ contents. This can explained as the space charge effects. These results are could be applied to the lower dielectrics layer of PDP required high reflective ratio and breakdown strength.
Keywords
dielectric; reflectance; dielectric characteristics$TiO_2$;
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