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http://dx.doi.org/10.5573/ieie.2016.53.1.107

Adaptive Defect Detection Method based on Skewness of the Histogram in LCD Image  

Gu, Eunhye (Graduate School of Electronics Engineering, Kyungpook National University)
Park, Kil-Houm (Graduate School of Electronics Engineering, Kyungpook National University)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.53, no.1, 2016 , pp. 107-117 More about this Journal
Abstract
STD method using a mean and standard deviation is widely used in various inspection systems. The result of detection using the STD method is very dependent on the threshold value. This paper proposes an adaptive defect detection algorithm to with a precise detection of an ultimate defect. The proposed method is determined threshold value adaptively using a skewness that indicates a similarity of intensity and normal distribution of image. In the experiment, we used a various TFT-LCD images for a quantitative evaluation of defect detection performance evaluation result to prove the performance of the proposed algorithm.
Keywords
히스토그램;순차적 검출;비대칭도;결함 검출;
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Times Cited By KSCI : 3  (Citation Analysis)
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1 J. Jang, S. K. Lim and M. H. Oh, "Technology development and production of flat panel displays in Korea," Proceedings of the IEEE. Vol. 90, no. 4, pp. 501-513, 2002.   DOI
2 C. B. Moon, Y. H. Ahn, H. Y. Lee, B. M. Kim, and D. W. Oh, "Implementation of Automatic Detection System for CCFL's Defects based on Combined Lighting," Journal of the Korea Industrial Systems Research, Vol. 15, No. 2, pp. 69-80, 2010.
3 Y. C. Cho, B. J. Choi, and J. O. Yoon, "A Study on the Development of Backlight Surface Defect Inspection System using Computer Vision," Journal of the Korea Industrial Systems Research, Vol. 12, No. 3, pp. 116-123, 2007.
4 S. W. Sohn, G. T. Ryu and H. D. Bae, "An Image Processing Technique for Polarizing Film Defects Detection," Journal of The Institute of Electronics Engineers of Korea, Vol. 45, no. IE-2, pp. 20-27, 2008.
5 J. H. Ko, "LCD Defect Detection using Neural - network based on BEP," Journal of The Institute of Electronics Engineers of Korea, Vol. 48, no. IE-2, pp. 26-31, 2011.
6 W. G. Jeon and Y. S. Cho, "An equalization tec X. B. C. Zhuang and H. Ding," "A New Mura Defect Inspection Way for TFT-LCD using Level Set Method," IEEE Signal Processing Letter, Vol. 16, Issue. 4, pp. 311-314, 2009.   DOI
7 N. Otsu, "A Threshold Selection Method from Gray-Level Histograms," IEEE Transactions on Systems, Man, and Cybernetics, Vol. 9, No. 1, pp. 62-66, 1979.   DOI
8 W. S. Kim, D. M. Kwak, Y. C. Song, D. H. Choi and K. H. Park, "Detection of Spot-Type Defects on Liquid Crystal Display Modules," Key Engineering Materials, Vol. 270-273, pp. 808-813, 2004.   DOI
9 S. M. Lee, T. H. Kim, and K. H. Park, "A Sequential Defect Detection According to Defect Possibility in TFT-LCD Panel Image," Journal of the Electronics and Information Engineers, Vol. 51, No. 4, pp. 799-806, 2014.
10 J. G. Oh, and M. C. Hong, "A Contrast Enhancement Method for Color Image Using Skewness Mapping Based Retinex," Journal of the Electronics and Information Engineers, pp. 496-499, Seoul, Korea, 2011.
11 S. X. Wang and A. M. Taratorin, Magnetic Information Storage Technology, Academic Press, 1999, ch. 12.
12 B. Jeon and J. Jeong, "Blocking artifacts reduction in image compression with block boundary discontinuity criterion," IEEE Trans. Circuits and Systems for Video Tech., Vol. 8, no. 3, pp. 345-357, June 1998.   DOI
13 W. G. Jeon and Y. S. Cho, "An equalization technique for OFDM and MC-CDMA in a multipath fading channels," in Proc. of IEEE Conf. on Acoustics, Speech and Signal Processing, pp. 2529-2532, Munich, Germany, May 1997.