Browse > Article
http://dx.doi.org/10.5573/ieie.2015.52.5.074

Evaluation of EM Susceptibility of an PLL on Power Domain Networks of Various Printed Circuit Boards  

Hwang, Won-Jun (Department of Electronic Engineering, Soongsil University)
Wee, Jae-Kyung (Department of Electronic Engineering, Soongsil University)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.52, no.5, 2015 , pp. 74-82 More about this Journal
Abstract
As the complexity of an electronic device and the reduction of its operating voltage is progressing, susceptibility test of the chip and module for internal or external noises is essential. Although the immunity compliance of the chip was served with IEC 62132-4 Direct Power Injection method as an industry standard, in fact, EM immunity of the chip is influenced by their Power Domain Network (PDN). This paper evaluates the EM noise tolerance of a PLL and compares their noise transfer characteristics to the PLL on various PCB boards. To make differences of the PDNs of PCBs, various PCBs with or without LDO and with several types of capacitors are tested. For evaluation of discrepancies between EM characteristics of an IC only and the IC on real boards, the analysis of the noise transfer characteristics according to the PDNs shows that it gives important information for the design having robust EM characteristics. DPI measurement results show that greatly improved immunity of the PLL in the low-frequency region according to using the LDO and a frequency change of the PLL according to the DPI could also check with TEM cell measurement spectrum.
Keywords
PDN; DPI; PLL; EMI; EMS;
Citations & Related Records
연도 인용수 순위
  • Reference
1 M. Ramdani, S. B. Dhia, M. Coenen, "The Electromagnetic Compatibility of Integrated Circuits-Past, Present, and Future", IEEE Transaction on Electromagnetic Compatibility vol.51, no.1, pp.78-100, Feb. 2009.   DOI   ScienceOn
2 I. Chahine, M. Kadi, E. Gaboriaud, A. Louis and B. Mazari, "Characterization and modeling of the susceptibility of integrated circuits to conducted electromagnetic disturbances up to 1 GHz," IEEE Transactions on Electromagnetic Compatibility, vol. 50, no. 2, pp. 285-293, May 2008.11-15, pp. 440-614, Feb., 2007.   DOI   ScienceOn
3 Wu Jian-fei, Etienne Sicard, Amadou Cisse Ndoye, Frederic Lafon, Li Jian-cheng, Shen Rong-jun, "Investigation on DPI Effects in a Low Dropout Voltage Regulator," EMC Compo 2011 - 8th Workshop on Electromagnetic Compatibility of Integrated Circuits, pp. 153-158, November 6-9, Dubrovnik, Croatia, 2011.
4 IEC 62132, Ed.1: Integrated Circuit-Measurementsof electromagnetic Immunity - 150kHz to 1GHz.
5 IEC 62132-4, 2003, "Direct RF Power Injection to measure the immunity against conducted RF-disturbances of integrated circuits up to 1 GHz", IEC standard.
6 IEC 61967-2, 2003, Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -Part 2: Measurement of radiated emissions-TEM cell and wideband TEM cell method
7 Ali Alaeldine, Richard Perdriau, Mohamed Ramdani, "A Direct Power Injection Model for Immunity Prediction in Integrated Circuits.", IEEE Transactions on Electromagnetic Compatibility, Vol. 50, No. 1, February 2008.
8 Bo Pu, Jae Joong Lee, Sang Keun Kwak, So Young Kim, Wansoo Nah, "Electromagnetic Susceptibility Analysis of ICs using DPI Method with Consideration of PDN", IEEE, 2012.
9 3D 해석 및 Lumped 모델 혼용 하이브리드 모델링 방법을 이용한 PLL 보드 내성 예측 및 평가