A Method of Inspecting ITO Pattern and Node Using Measured Data of Each Node's Mutual Capacitance ITO Sensor |
Han, Joo-Dong
(Dept of Electronics Eng, Kyung Hee University)
Moon, Byoung-Joon (Dept of Automotive Eng, Daeduk College) Choi, Kyung-Jin (MIRTEC) Kim, Dong-Han (Dept of Electronics Eng, Kyung Hee University) |
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