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http://dx.doi.org/10.5573/ieie.2014.51.5.106

FDR Test Compression Algorithm based on Frequency-ordered  

Mun, Changmin (Department of Computer Science & Engineering, Hanyang University)
Kim, Dooyoung (Department of Computer Science & Engineering, Hanyang University)
Park, Sungju (Department of Computer Science & Engineering, Hanyang University)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.51, no.5, 2014 , pp. 106-113 More about this Journal
Abstract
Recently, to reduce test cost by efficiently compressing test patterns for SOCs(System-on-a-chip), different compression techniques have been proposed including the FDR(Frequency-directed run-length) algorithm. FDR is extended to EFDR(Extended-FDR), SAFDR(Shifted-Alternate-FDR) and VPDFDR(Variable Prefix Dual-FDR) to improve the compression ratio. In this paper, a frequency-ordered modification is proposed to further augment the compression ratios of FDR, EFDR, SAFRD and VPDFDR. The compression ratio can be maximized by using frequency-ordered method and consequently the overall manufacturing test cost and time can be reduced significantly.
Keywords
Test Pattern Compression; FDR Algorithm;
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