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http://dx.doi.org/10.5573/ieie.2014.51.12.059

Measurement and Analysis of Gate Finger Number Dependence of Input Resistance for Sub-micron MOSFETs  

Ahn, Jahyun (Department of Electronics Engineering, Hankuk University of Foreign Studies)
Lee, Seonghearn (Department of Electronics Engineering, Hankuk University of Foreign Studies)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.51, no.12, 2014 , pp. 59-65 More about this Journal
Abstract
Two input resistances converted from $S_{11}$-parameter and $Z_{11}$-parameter of MOSFETs with various gate finger numbers Nf were measured in low frequency region. The 1/Nf dependent input resistance from $S_{11}$-parameter exhibits much lower values than that from $Z_{11}$-parameter in the range of $Nf{\leq}64$. This 1/Nf dependence was theoretically verified by using Nf dependent nonlinear equation derived from a MOSFET equivalent circuit.
Keywords
MOSFET; input resistance; S-parameter; Z-parameter; gate finger number;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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