Reduced Pin Count Test Techniques using IEEE Std. 1149.7 |
Lim, Myunghoon
(Department of Computer Science & Engineering, Hanyang University)
Kim, Dooyoung (Department of Computer Science & Engineering, Hanyang University) Mun, Changmin (Department of Computer Science & Engineering, Hanyang University) Park, Sungju (Department of Computer Science & Engineering, Hanyang University) |
1 | J. Jahangiri, N. Mukherjee, C. Wu-Tung, S. Mahadevan, and R. Press, "Achieving High Test Quality with Reduced Pin Count Testing," in Proc. of IEEE Asian Test Symposium, pp. 312-317, Dec 2005. |
2 | 이현빈, 한주희, 김병진, 박성주, "IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩코아 테스트", 대한전자공학회 논문지, 제45권 SD편 2호, pp.61-68, Feb 2008. 과학기술학회마을 |
3 | S. Hwang and J. A. Abraham, "Test Data Compression and Test Time Reduction Using an Embedded Microprocessor," IEEE Trans. on VLSI Systems, Vol. 11, pp. 853-862, Oct 2003. DOI ScienceOn |
4 | H. Hashempour, F. J. Meyer, and F. Lombardi, "Analysis and Evaluation of Multisite Testing for VLSI," IEEE Trans. on Instrumentation and Measurement, Vol. 54, pp.1770-1778, Oct 2005. DOI ScienceOn |
5 | Adam. W. L., "Doing More with Less - An IEEE 1149.7 Embedded Tutorial : Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary-Scan Architecture," in Proc. of IEEE Test Conf., pp.1-10, Austin, US, Nov 2009. |
6 | H. Yi, J. Song, and S. Park "Low-Cost Scan Test for IEEE-1500-Based SoC,"" IEEE Transactions on Instrumentation and Measurement, Vol. 57, pp.1071-1078, May 2008. DOI ScienceOn |
7 | J. Song, P. Min, H. Yi, and S. Park, "Design of Test Access Mechanism for AMBA Based System-on-a-Chip," IEEE VTS, pp. 375-380, Berkeley, US, May 2007. |
8 | "IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture," IEEE Std1149.7- 2009, pp.c1-985, Feb 2010. |
9 | H. Vranken, et al, "Enhanced Reduced Pin-Count Test for Full-Scan Design," in Procs. of IEEE International Test Conference, pp. 738-747, 2001. |
10 | Y. Zorian, A. Yessayan, "IEEE 1500 utilization in SoC design and test," IEEE proc. of International Test Conference, Nov 2005. |
11 | 송재훈, 오정섭, 박성주, "AMBA 기반 SoC의 병렬코어 테스트를 위한 효과적인 테스트 설계 기술", 대한전자공학회 논문지, 제48권 SD편 2호, pp.44-54, Feb 2011. |