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http://dx.doi.org/10.5573/ieek.2013.50.5.183

Micro-crack Detection in Polycrystalline Solar Cells using Improved Anisotropic Diffusion Model  

Ko, JinSeok (Dept. of Electrical, Electronics and Communication Engineering, Korea University of Technology and Education)
Rheem, JaeYeol (Dept. of Electrical, Electronics and Communication Engineering, Korea University of Technology and Education)
Publication Information
Journal of the Institute of Electronics and Information Engineers / v.50, no.5, 2013 , pp. 183-190 More about this Journal
Abstract
In this paper, we propose an improved anisotropic diffusion model for micro-crack detection in heterogeneously textured surface of polycrystalline solar wafers. Due to the nature of the image sensor, the gray-level of the diagonal micro-crack is non-uniform. Thus, the conventional algorithms can't fully detect diagonal micro-cracks when the number of iteration is not enough. However, the increasing of the iteration number leads to increase computation time and detects micro-crack thicker than the original micro-crack. In order to overcome this drawback, we use the gradient of north, south, east, and west directions as well as extended directions. To calculate the diffusion coefficients, we compare the gradients of conventional directions and extended directions and apply the larger gradient values to the coefficient function. This is because the proposed method reflects the information of diagonal micro-crack. Comparing to Tsai et al.'s and Ko and Rheem's, the proposed algorithm shows superior efficiency in detecting the diagonal micro-cracks with less iterations in the images of polycrystalline solar wafers. In addition, it also shows that the thickness of segmented micro-crack is similar to the orignal micro-crack.
Keywords
anisotropic diffusion model; micro-crack detection; solar wafer; defect detection;
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