Difference Edge Acquisition for B-spline Active Contour-Based Face Detection |
Kim, Ga-Hyun
(School of Electrical and Electronic Engineering, Yonsei University, Biometric Engineering Research Center)
Jung, Ho-Gi (School of Electrical and Electronic Engineering, Yonsei University, Biometric Engineering Research Center) Suhr, Jae-Kyu (School of Electrical and Electronic Engineering, Yonsei University, Biometric Engineering Research Center) Kim, Jai-Hie (School of Electrical and Electronic Engineering, Yonsei University, Biometric Engineering Research Center) |
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